Metrology

Laser light provides unique potential for measuring distances, movements, mapping areas when the wavelength and other properties of the laser are well controlled. To optimally benefit from this potential, we believe laser photonics should in addition be more simple, robust, compact and cost effective. We enable this potential with our modules based on hyper-spectral (400-2300 nm) Photonic Integrated Circuits.

LioniX International designs and manufactures customized modules for photonic OEMs and system integrators. The PIC modules are based on our photonic integration technology and can manipulate laser light by splitting beams, combining beams, controlling intensity, phase, mode size and input-, output configurations.

Our PIC modules are used in different types of products for metrology applications such as: laser interferometry (homodyne, heterodyne and multiwavelength detection), optical coherence tomography (OCT) and spectrometry.

In many applications for optical metrology, one or more lasers are used to measure distances, surfaces or motion. Typically also the position and spot size of the light at the substrate or target are subject to tight specifications. These sizable systems are currently built using discrete optical components. Our PICs are beneficial for these applications as they increase robustness, reliability and compactness and open the route to new methods of measuring.